NCFST and Avure PATS Process Wins 2009 IFT Food Expo Innovation Award
Award recognizes pioneering food safety process as a technology
“with significant scientific merit and representing a major technical advancement”
(ANAHEIM, CA) June 7, 2009 – The National Center for Food Safety and Technology (NCFST), Illinois Institute of Technology (IIT), is pleased to announce that the consortium’s pressure-assisted thermal sterilization (PATS) process, won an IFT Food Expo Innovation Award at the 2009 Institute of Food Technologists (IFT) Annual Meeting & Food Expo in Anaheim today.
ncfstpatsinnovationaward.pdf (138.75 kB)