NCFST and Avure PATS Process Wins 2009 IFT Food Expo Innovation Award
Award recognizes pioneering food safety process as a technology
“with significant scientific merit and representing a major technical advancement”
(ANAHEIM, CA) June 7, 2009 – The National Center for Food Safety and Technology (NCFST), Illinois Institute of Technology (IIT), is pleased to announce that the consortium’s pressure-assisted thermal sterilization (PATS) process, won an IFT Food Expo Innovation Award at the 2009 Institute of Food Technologists (IFT) Annual Meeting & Food Expo in Anaheim today.
ncfstpatsinnovationaward.pdf (138.75 kB)
NCFST DUST consortium members display the IFT Innovation Award for the development of pressure assisted thermal sterilization (PATS), a novel food safety technology, at the 2009 IFT Annual Meeting & Expo in Anaheim, CA. (From left) Larry Keener, International Product Safety Consultants, LLC; Martin Cole, National Center for Food Safety and Technology; Phillip Minerich, Hormel Foods; Cindy Stewart, Silliker Laboratories; C. Patrick Dunne, US Department of Defense Combat Feeding Directorate, US Army Natick Soldier RDEC; Glenn Hewson, Avure Technologies; Kern Cooper, Basic American Foods; Richard Meyer, Washington Farms; and Raghupathy Ramaswamy, Avure Technologies.